Surface analysis instruments
X-ray photoelectron spectroscopy (XPS)
Time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Auger electron spectroscopy (AES)
Software solutions for surface analysis
Data reduction software
Support and service contracts
ReACH compliance services
Surface analysis services
Thin film analysis services
XPS/ESCA/HAXPES analysis
TOF-SIMS analysis
AES analysis
Support services
Service contracts
Worldwide factory service
ReACH compliance
Parts/Materials return declaration
Product refurbishment
System upgrades
System software
SmartSoft for VPIII
StrataPHI
TOF-SIMS Data Reduction Software
SmartSoft for XPS
MultiPak Data Reduction Software
