Analytical instruments for surface analysis
X-ray Photoelectron Spectroscopy (XPS) services
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) services
Auger Electron Spectroscopy (AES) services
System upgrades and software for surface analysis instruments
XPS/ESCA/HAXPES analysis services
TOF-SIMS analysis services
AES analysis services
System upgrades and software for surface analysis equipment
Remote system operation and diagnostics services
Products
Analytical Services
System Upgrades
System Software
Support Services
