k-Space Associates, Inc.
k-Space Associates (kSA)別名
銘柄コード
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上場市場
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国
従業員（単独）
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関連会社
23
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基本情報
- 所在地
- Southeastern Michigan
- 社長
- 従業員数(単独)
- 従業員数(連結)
- 開始日
- 終了日
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サイト
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事業内容
Reflection High-Energy Electron Diffraction (RHEED) systemsThin-film deposition control systemsReal-time temperature measurement of semiconductor substratesWafer curvature and tilt measurement systemsIn situ metrology tools for MOCVD and MBE reactorsSpectral reflectance monitoringEmissometer for carrier end-of-life detectionRHEED simulation softwareMetrology accessoriesThin-film characterization servicesCustom solar panel metrology toolsCustom inspection solutionsFactory integration servicesInline metrologyAutomotive inspection toolsDefect detection solutionsIndustrial inspection toolsColor measurement for glassBarcode inspectionIn-line PV process monitoringCustom non-contact measurement and software integrationProviding technical support for k‑Space productsProviding product informationDistributing k‑Space productsMarketing and sales of k‑Space productsReflection High-Energy Electron Diffraction (RHEED) systemAtomic flux control for thin-film depositionReal-time absolute temperature measurement of semiconductor substratesReal-time monitoring for curvature, stress, reflectivity, and growth rateHigh-resolution wafer curvature, bow, and tilt measurement systemsIn situ metrology tool for MOCVD and MBE reactorsReal-time wafer and film spectral reflectance monitorOptically-based absolute temperature measurement and calibration toolCarrier end-of-life determination for thin filmsRHEED screens and beam alignment substratesDefect detection toolsBarcode inspection toolsIn-situ metrologyThin-film metrologyWafer temperature measurementSpectroscopic analysisThermal scanningEmissometryPyrometrySpectral temperature measurementRate ratio measurementMOS analysisPV analysisThin-film metrology solutionsAutomotive inspectionDefect detectionIndustrial inspectionInline glass defect detection using machine learningIn-line metrologyEmissometerScanning pyrographySpectra temperature measurementICEAccessoriesRateRat ProMOS Ultra/ThermalScanMOSBandiT PVBandiTkSA 400
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関連会社
| 会社名 | Group | 親会社 | 子会社 | 得意先 | 仕入先 | 業務提携 | 銀行等 | 株主等 |
|---|---|---|---|---|---|---|---|---|
| kSA BandiT PV | ||||||||
| kSA MOS | ||||||||
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| Boise State University | ||||||||
| Boston University | ||||||||
| Brown University | ||||||||
| California Institute of Technology | ||||||||
| Carnegie Mellon University | ||||||||
| Case Western Reserve University | ||||||||
| Cornell University | ||||||||
| Drexel University | ||||||||
| Duke University | ||||||||
| Florida A&M University | ||||||||
| Florida International University | ||||||||
| Florida State University | ||||||||
| Georgia Institute of Technology | ||||||||
| Harvard University | ||||||||
| Johns Hopkins University | ||||||||
| Lehigh University | ||||||||
| Louisiana State University – Baton Rouge | ||||||||
| Massachusetts Institute of Technology | ||||||||
| McGill University | ||||||||
| Michigan State University |
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関連図
資本関係
得意先
仕入先
業務提携
銀行・株主
ドラッグで移動 · クリックで詳細へ
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沿革
Founded in 1992 and known for custom development and unparalleled technical support, our metrology systems are used in research and production facilities around the world. Through extensive customer input and close collaboration with our customer base, k-Space has developed today’s most powerful metrology tools.
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ニュース
ニュースはありません。
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