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SmartSoft for VPIII
StrataPHI
TOF-SIMS Data Reduction Software
SmartSoft for XPS
MultiPak Data Reduction Software
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Genesis
710
nanoTOF 3
Adept 2
Refurbished
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System Software
StrataPHI - Software for Thin Film Structure Analysis
XPS/ESCA/HAXPES
TOF-SIMS
AES
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Worldwide Factory Service
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PHI Analytical Services
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X-ray photoelectron spectroscopy (XPS) surface analysis
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) surface analysis
Auger electron spectroscopy (AES) surface analysis
Surface analysis solutions
Customer service
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ReACH compliance support
Remotely Assisted Customer Help
Resource Material
EOS for FEI LMIG